NOTE: Displayed times are in EDT - Montréal Time

Technical Program

TH-UA.1P: Measurements of Material Properties

Track: URSI-A: Electromagnetic Metrology
Session Chairs: Steven Weiss, US Army Research Laboratory and Jeanne Quimby, National Institute of Standards and Technology
Hau Wah Lai, Shing Lung Yang, Kam Yuen Chan, Cho Man Tsui, Innovation and Technology Commission, Hong Kong SAR of China; Kwai Man Luk, City University of Hong Kong, Hong Kong SAR of China
Edgar Oblitas, Universidad Peruana de Ciencias Aplicadas, Peru; Zeeshan Qamar, University of Oklahoma, United States; Carlos Ibanez, Universidad Peruana de Ciencias Aplicadas, Peru; Jorge Salazar-Cerreno, University of Oklahoma, United States
Seckin Sahin, The Ohio State University, United States; Niru Nahar, Ohio State University, United States; Kubilay Sertel, The Ohio State University, United States
Abdelrahman Ijjeh, Marylene Cueille, Jean-Lou Dubard, Université Côte d'Azur, France; Michel Ney, IMT-Atlantique, France
Luis Gomez, Moritz Dannhauer, Angel Peterchev, Duke University School of Medicine, United States