Faris Alsolamy, Anthony Grbic, University of Michigan, United States
Gengyu Xu, George Eleftheriades, Sean Hum, University of Toronto, Canada
Jordan Budhu, Anthony Grbic, Eric Michielssen, University of Michigan, United States
Dominik Barbaric, Ericsson Nikola Tesla d.d., Croatia (Hrvatska); Zvonimir Sipus, University of Zagreb, Croatia (Hrvatska)
Tomoki Abe, Junji Yamauchi, Hisamatsu Nakano, Hosei University, Japan
Daniel King, Carleton University, Canada; Khelifa Hettak, Reza Chaharmir, Jonathan Ethier, Communications Research Centre, Canada; Shulabh Gupta, Carleton University, Canada
Rui Feng, Key Laboratory of Integrated Services Networks - Xidian University, China; Badreddine Ratni, Université Paris Nanterre - Laboratoire Energétique Mécanique Electromagnétisme (LEME), France; Yi Jianjia, School of Electronics and Information Engineering Xi’an Jiaotong University, China; Zhang Hailin, Key Laboratory of Integrated Services Networks, Xidian University, China; Gerard-Pascal Piau, Université Paris Nanterre - Laboratoire Energétique Mécanique Electromagnétisme, France; Andre de Lustrac, Universite Paris-Saclay - Centre de Nanosciences et de Nanotechnologies, France; Shah Nawaz Burokur, Université Paris Nanterre - Laboratoire Energétique Mécanique Electromagnétisme (LEME), France
Mingbo Xin, Yiting Liu, Rensheng Xie, Xin Fang, Guohua Zhai, Jianjun Gao, School of Physics and Electronic Science, China; Chang Chen, School of Information Science and Technology, China; Jun Ding, School of Physics and Electronic Science, China