Jerika Cleveland, Jacob Lewis, Dipankar Mitra, Benjamin Braaten, North Dakota State University, United States; Jeffery Allen, Monica Allen, Air Force Research Laboratory, United States
Nim Rod Ccoillo Ramos, Nafati Aboserwal, Zeeshan Qamar, Jorge Salazar Cerreno, The University of Oklahoma, United States
Alessandro Cidronali, Giovanni Collodi, Matteo Lucarelli, Stefano Maddio, Giuseppe Pelosi, Stefano Selleri, University of Florence, Italy
Vignesh Shanmugam Bhaskar, Eng Leong Tan, NANYANG TECHNOLOGICAL UNIVERSITY, Singapore
Chongqi Zhang, Qiang Chen, Shanghai University of Engineering Science, China; Mei Song Tong, Tongji University, China; Shujia Yan, Mengru Chen, Haijing Sun, Shanghai University of Engineering Science, China
Ruben Del-Rio-Ruiz, Juan-Manuel Lopez-Garde, Jon Legarda, University of Deusto - DeustoTech, Spain
Zahra Esmati, David A. Powell, J. Scott Tyo, University of New South Wales, Australia
Yi-Wen Chiu¬, Chen-Pang Chao, Yu-Cheng Huang, Chang-Fa Yang, National Taiwan University of Science and Technology, Taiwan; Wen-Hsiung Lin, Jorjin Technologies Inc, Taiwan; Chun-Yi Chai, XMMSE, Taiwan; Ike Lin, Bryan Chu, WaveFidelity Inc, Taiwan
Ke He, Mengxia Yu, E Zhao, Guiping Li, Maoyan Wang, University of Electronic Science and Technology of China (UESTC), China; Jing Ma, Science and Technology on Special System Simulation Laboratory, China
Fangyun Peng, Xiaoming Chen, Ming Zhang, Xi'an Jiaotong University, China; Jiaying Zhang, EM-Testing, China
