Sean Ellison, Jeffrey Nanzer, Michigan State University, United States
Jason Merlo, Eric Klinefelter, Jeffrey A. Nanzer, Michigan State University, United States
Álvaro F. Vaquero, Manuel Arrebola, Marcos R. Pino, Universidad de Oviedo, Spain; Rafael Florencio, Universidad de Alcala, Spain; Jose A. Encinar, Universidad Politécnica de Madrid, Spain
Derek Campbell, C.J. Reddy, Altair, United States
Stuart Gregson, Next Phase Measurements, United States; Clive Parini, Queen Mary University of London, United Kingdom
Bernd Hofmann, Oliver Kraus, Thomas F. Eibert, Technical University of Munich, Germany
Brett Walkenhorst, Patrick Pelland, NSI-MI Technologies, United States; Thomas Leifert, Keysight Technologies, United States; Mihai Berbeci, NSI-MI UK, United States
Lucia Scialacqua, Francesca Mioc, Alessandro Scannavini, Lars Jacob Foged, Microwave Vision Italy, Italy
Md Nurul Anwar Tarek, Florida International University, United States; Markus Novak, Novaa Ltd., United States; Elias A. Alwan, Florida International University, United States
Ziyang Zheng, Yulin Fang, Junfa Mao, Shanghai Jiao Tong University, China