Sung Yun Jun, Derek Caudill, Jelena Senic, Camillo Gentile, Jack Chuang, Nada Golmie, National Institute of Standards and Technology, United States
Bernardo Bernardo, Herman Fernández, Vicent M. Rodrigo-Peñarrocha, Juan Reig, Lorenzo Rubio, Universitat Politecnica de Valencia, Spain
Dmitry Chizhik, Jinfeng Du, Reinaldo Valenzuela, Dragan Samardzija, Stepan Kucera, Dmitry Kozlov, Rolf Fuchs, Nokia, United States
Peize Zhang, Haiming Wang, Wei Hong, Southeast University, China
Min Gao, The 38th Research Institute of China Electronics Technology Group Corporation, China; Zhiyu Xing, Jianhua Yang, Rui Wang, University of Electronic Science and Technology of China, China
Miguel Riobó, Manuel García Sanchez, Iñigo Cuiñas, Isabel Exposito, Universidade de Vigo, Spain; Jo Verhaevert, Rob Hofman, Ghent University / imec, Belgium
Manuel Garcia Sanchez, Iñigo Cuiñas, Universidade de Vigo, Spain; Arne Feys, Wout Debaenst, Jo Verhaevert, Ghent University / imec, Belgium
Gloria Makhoul, Raffaele D'Errico, CEA-Leti, France; Claude Oestges, Université catholique de Louvain, Belgium
Yuyan Shen, Yu Shao, Xi Liao, Yang Wang, Jie Zhang, Chongqing University of Posts and Telecommunications, China
